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HARVARD Citation
Homm, G. et al. (n.d.). Effects of interface geometry on the thermoelectric properties of laterally microstructured ZnO‐based thin films. Physica status solidi. 210 (1), pp. 119-124. [Online].
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Homm, G. et al. (n.d.). Effects of interface geometry on the thermoelectric properties of laterally microstructured ZnO‐based thin films. Physica status solidi. 210 (1), pp. 119-124. [Online].