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HARVARD Citation
Gabrysch, M. et al. (2013). XUV‐induced transient phase gratings for probing ultra‐fast carrier generation and recombination processes in wide‐bandgap semiconductors. Annalen der Physik. 525 (1), pp. 59-65. [Online].
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Gabrysch, M. et al. (2013). XUV‐induced transient phase gratings for probing ultra‐fast carrier generation and recombination processes in wide‐bandgap semiconductors. Annalen der Physik. 525 (1), pp. 59-65. [Online].