Microstructure and interfacial chemistry of pure and La‐doped BiFeO3 thin films. Issue 12 (17th October 2013)

• Record Type: Journal Article
• Authors: Basu, Joysurya; Katoch, Rajesh; Garg, Ashish; Barry Carter, C.
• Is Part Of: Microscopy research and technique. Volume 76:Issue 12(2013:Dec.)
• Page Start: 1304
• Page End: 1309
• Publication Date: 2013-10-17
• Subjects: Electron microscopy -- Technique -- Periodicals; Microscopy -- Periodicals; Microscopy -- Technique -- Periodicals; 502.825
• DOI: 10.1002/jemt.22302
• Languages: English
• ISSNs: 1059-910X

Abstract

<abstract abstract-type="main"> <title>Abstract</title> <p>We report on the microstructure and interfacial chemistry of thin films of pure and La‐doped multiferroic bismuth ferrite (Bi_1‐xLa_xFeO₃ or BLFO), synthesized on Indium Tin Oxide‐coated glass substrates by solution‐deposition technique and studied using scanning transmission electron microscopy. Our results show that undoped and La‐doped thin films are polycrystalline with distorted rhombohedral structure without any presence of any line or planar defect in the films. In addition, the films with La doping did not show any structural change and maintain the equilibrium structure. Cross section compositional analysis using X‐ray energy dispersive spectrometry did not reveal either any interdiffusion of chemical species or formation of reaction product at the film‐substrate interface. However, a closer examination of the microstructure of the films shows tiny pores along with the presence of ∼2–3 nm thin amorphous layers, which may have significant influence on the functional properties of such films. <italic>Microsc. Res. Tech. 76:1304–1309, 2013</italic>. © 2013 Wiley Periodicals, Inc.</p> </abstract>