A Direct Evidence of Morphological Degradation on a Nanometer Scale in Polymer Solar Cells. (12th September 2013)

• Record Type: Journal Article
• Authors: Schaffer, Christoph J.; Palumbiny, Claudia M.; Niedermeier, Martin A.; Jendrzejewski, Christian; Santoro, Gonzalo; Roth, Stephan V.; Müller‐Buschbaum, Peter
• Is Part Of: Advanced materials. Volume 25:Number 46(2013)
• Page Start: 6760
• Page End: 6764
• Publication Date: 2013-09-12
• Subjects: Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201302854
• Languages: English
• ISSNs: 0935-9648

Abstract

<abstract abstract-type="graphical" xml:lang="en" id="adma201302854-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <bold>In situ measurement of a polymer solar cell</bold> using micro grazing incidence small angle X‐ray scattering (μGISAXS) and current–voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X‐ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgg3zk6phn8" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>