Spatially‐Resolved In‐Situ Structural Study of Organic Electronic Devices with Nanoscale Resolution: The Plasmonic Photovoltaic Case Study. (24th July 2013)

• Record Type: Journal Article
• Authors: Paci, B.; Bailo, D.; Albertini, V. Rossi; Wright, J.; Ferrero, C.; Spyropoulos, G. D.; Stratakis, E.; Kymakis, E.
• Is Part Of: Advanced materials. Volume 25:Number 34(2013)
• Page Start: 4760
• Page End: 4765
• Publication Date: 2013-07-24
• Subjects: Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201301682
• Languages: English
• ISSNs: 0935-9648

Abstract

<abstract abstract-type="graphical" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <bold>A novel high spatial resolution</bold> synchrotron X‐ray diffraction stratigraphy technique has been applied in‐situ to an integrated plasmonic nanoparticle‐based organic photovoltaic device. This original approach allows for the disclosure of structure‐property relations linking large scale organic devices to length scales of local nano/hetero structures and interfaces between the different components. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgg36gzwsqp" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>