Characterization of the thermoresponsive shape‐memory effect in poly(ether ether ketone) (PEEK). Issue 3 (12th September 2013)

• Record Type: Journal Article
• Authors: Wu, Xue Lian; Huang, Wei Min; Ding, Zhen; Tan, Hui Xin; Yang, Wen Guang; Sun, Ke Yuan
• Is Part Of: Journal of applied polymer science. Volume 131:Issue 3(2014:Feb. 05)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2013-09-12
• Subjects: Polymers -- Periodicals; Polymerization -- Periodicals; 668.9
• DOI: 10.1002/app.39844
• Languages: English
• ISSNs: 0021-8995

Abstract

<abstract abstract-type="main"> <title>ABSTRACT</title> <p>We conducted a systematic experimental investigation to characterize the shape‐memory effect in a commercial poly(ether ether ketone) (PEEK), which is a very important high‐temperature polymers at present. The focus was on the influence of the programming conditions and heating temperature for recovery on the shape‐recovery ratio (<italic>R</italic>_{<italic>r</italic>}). We concluded that PEEK is not only an important engineering polymer as it is traditionally known but is also an excellent high‐temperature shape‐memory polymer. For a residual programming strain of 30%, the maximum <italic>R</italic>_{<italic>r</italic>} was about 90%. It was revealed that it was practically feasible to program PEEK at room temperature and to lower the recovery temperature from its melting temperature range to around its glass‐transition temperature. © 2013 Wiley Periodicals, Inc. J. Appl. Polym. Sci. <bold>2014</bold>, <italic>131</italic>, 39844.</p> </abstract>