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Su, C. et al. (n.d.). A Novel Multi‐hidden Semi‐Markov Model for Degradation State Identification and Remaining Useful Life Estimation. Quality and reliability engineering international. pp. 1181-1192. [Online].
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Su, C. et al. (n.d.). A Novel Multi‐hidden Semi‐Markov Model for Degradation State Identification and Remaining Useful Life Estimation. Quality and reliability engineering international. pp. 1181-1192. [Online].