Data and device protection: A ToF‐SIMS, wetting, and XPS study of an Apple iPod nano. (6th December 2013)

• Record Type: Journal Article
• Authors: Gupta, Vipul; Tuscano, Joshua A.; Romriell, Naomi R.; Davis, Robert C.; Linford, Matthew R.
• Is Part Of: Surface and interface analysis. Volume 46:Number 2(2014)
• Page Start: 106
• Page End: 108
• Publication Date: 2013-12-06
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5352
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>An important aspect of the robustness of an electronic device is its ability to resist water, fingerprints, dirt, and smudges that may compromise its ability to function and/or the information within it. Here, we report a chemical analysis by ToF‐SIMS, wetting, and XPS of the surfaces in a commercially available Apple iPod nano (8GB, MC525LL/A), which showed good resistance to its environment. This analysis reveals that the front panel (touchscreen) of the device is coated with a low free energy fluorinated polymer that may consist of short segments of a fluorinated hydrocarbon connected through ether linkages. No other part of the device appears to have this hydrophobic coating. A plasma treatment of the device leads to a deterioration of its performance. This work demonstrates how different analytical techniques can complement each other and contribute to a better understanding of a surface or a material. Copyright © 2013 John Wiley &amp; Sons, Ltd.</p> </abstract>