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HARVARD Citation
Lang, R. et al. (n.d.). Lattice strain distribution resolved by X‐ray Bragg‐surface diffraction in an Si matrix distorted by embedded FeSi2 nanoparticles. Journal of applied crystallography. pp. 1796-1804. [Online].
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Lang, R. et al. (n.d.). Lattice strain distribution resolved by X‐ray Bragg‐surface diffraction in an Si matrix distorted by embedded FeSi2 nanoparticles. Journal of applied crystallography. pp. 1796-1804. [Online].