Development of powder diffraction apparatus for small‐angle X‐ray scattering measurements. (18th March 2013)

• Record Type: Journal Article
• Authors: Bóta, Attila
• Is Part Of: Journal of applied crystallography. Volume 46:Part 2(2013:Apr.)
• Page Start: 573
• Page End: 576
• Publication Date: 2013-03-18
• Subjects: Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S002188981205162X
• Languages: English
• ISSNs: 0021-8898

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>A novel type of X‐ray collimation system attached to commercial powder diffractometers makes the structural characterization of nanomaterials possible in a wide size range from &lt;0.1 to 100 nm by combination of the small‐ and wide‐angle X‐ray scattering techniques. There is no dead interval in the detection between the small‐ and wide‐angle regimes. This device can be attached to any existing `θ/θ' powder diffractometer, providing a multi‐functional small‐ and wide‐angle X‐ray scattering/diffraction (SWAXS) apparatus. After proper alignment and adjustment, the device can be removed and re‐attached at any time to switch between normal and SWAXS functions.</p> </abstract>