Accurate measurements of intrinsic scattering from window materials by use of a vacuum camera. (18th March 2013)

• Record Type: Journal Article
• Authors: Masunaga, Hiroyasu; Sakurai, Kazuo; Akiba, Isamu; Ito, Kazuki; Takata, Masaki
• Is Part Of: Journal of applied crystallography. Volume 46:Part 2(2013:Apr.)
• Page Start: 577
• Page End: 579
• Publication Date: 2013-03-18
• Subjects: Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S0021889813002628
• Languages: English
• ISSNs: 0021-8898

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The intrinsic scattering from eight window materials commonly used at synchrotron facilities has been evaluated in the range 0.07 &lt; <italic>q</italic> &lt; 4 nm⁻¹ by the use of a vacuum camera. Poly(oxydiphenylene‐pyromellitimide) film, a polyimide film widely used as a window material for vacuum chambers, gave rise to two peaks at <italic>q</italic> = 0.8 and 4 nm⁻¹. Poly(ether‐ether‐ketone) gave no Bragg peaks, although the background scattering was relatively high over the entire <italic>q</italic> range. When natural mica, synthetic mica, quartz glass, beryllium, silicon nitride and silicon carbide were compared, synthetic mica showed the lowest scattering in the range 0.6 &lt; <italic>q</italic> &lt; 5 nm⁻¹, indicating that it is the most suitable window material for this <italic>q</italic> range.</p> </abstract>