Resonant X‐ray scattering studies of epitaxial complex oxide thin films. (18th January 2013)

• Record Type: Journal Article
• Authors: Perret, Edith; Park, Changyong; Fong, Dillon D.; Chang, Kee‐Chul; Ingram, Brian J.; Eastman, Jeffrey A.; Baldo, Peter M.; Fuoss, Paul H.
• Is Part Of: Journal of applied crystallography. Volume 46:Part 1(2013:Feb.)
• Page Start: 76
• Page End: 87
• Publication Date: 2013-01-18
• Subjects: Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S0021889812047620
• Languages: English
• ISSNs: 0021-8898

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Resonant anomalous X‐ray reflectivity (RAXR) is a powerful technique for measuring element‐specific distribution profiles across surfaces and buried interfaces. Here, the RAXR technique is applied to characterize a complex oxide heterostructure, La_0.6Sr_0.4Co_0.2Fe_0.8O_3−δ, on NdGaO₃, and the effects of data sampling and model‐dependent fitting procedures on the extracted elemental distribution profile are evaluated. The strontium profile through a 3.5 nm‐thick film at 973 K and at an oxygen partial pressure of 150 Torr (1 Torr = 133.32 Pa) was determined from the measured RAXR spectra. The results demonstrate that <italic>in situ</italic> RAXR measurements can provide key insights into temperature‐ and environment‐dependent elemental segregation processes, relevant, for example, in assessing the cathode performance of solid oxide fuel cells.</p> </abstract>