Ultrafast reciprocal‐space mapping with a convergent beam. (25th September 2013)

• Record Type: Journal Article
• Authors: Schick, Daniel; Shayduk, Roman; Bojahr, André; Herzog, Marc; von Korff Schmising, Clemens; Gaal, Peter; Bargheer, Matias
• Is Part Of: Journal of applied crystallography. Volume 46:Part 5(2013:Oct.)
• Page Start: 1372
• Page End: 1377
• Publication Date: 2013-09-25
• Subjects: Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S0021889813020013
• Languages: English
• ISSNs: 0021-8898

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>A diffractometer setup is presented, based on a laser‐driven plasma X‐ray source for reciprocal‐space mapping with femtosecond temporal resolution. In order to map out the reciprocal space, an X‐ray optic with a convergent beam is used with an X‐ray area detector to detect symmetrically and asymmetrically diffracted X‐ray photons simultaneously. The setup is particularly suited for measuring thin films or imperfect bulk samples with broad rocking curves. For quasi‐perfect crystalline samples with insignificant in‐plane Bragg peak broadening, the measured reciprocal‐space maps can be corrected for the known resolution function of the diffractometer in order to achieve high‐resolution rocking curves with improved data quality. In this case, the resolution of the diffractometer is not limited by the convergence of the incoming X‐ray beam but is solely determined by its energy bandwidth.</p> </abstract>