Complete elliptical ring geometry provides energy and instrument calibration for synchrotron‐based two‐dimensional X‐ray diffraction. (25th September 2013)

• Record Type: Journal Article
• Authors: Hart, Michael L.; Drakopoulos, Michael; Reinhard, Christina; Connolley, Thomas
• Is Part Of: Journal of applied crystallography. Volume 46:Part 5(2013:Oct.)
• Page Start: 1249
• Page End: 1260
• Publication Date: 2013-09-25
• Subjects: Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S0021889813022437
• Languages: English
• ISSNs: 0021-8898

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>A complete calibration method to characterize a static planar two‐dimensional detector for use in X‐ray diffraction at an arbitrary wavelength is described. This method is based upon geometry describing the point of intersection between a cone's axis and its elliptical conic section. This point of intersection is neither the ellipse centre nor one of the ellipse focal points, but some other point which lies in between. The presented solution is closed form, algebraic and non‐iterative in its application, and gives values for the X‐ray beam energy, the sample‐to‐detector distance, the location of the beam centre on the detector surface and the detector tilt relative to the incident beam. Previous techniques have tended to require prior knowledge of either the X‐ray beam energy or the sample‐to‐detector distance, whilst other techniques have been iterative. The new calibration procedure is performed by collecting diffraction data, in the form of diffraction rings from a powder standard, at known displacements of the detector along the beam path.</p> </abstract>