The investigation of NbO2 and Nb2O5 electronic structure by XPS, UPS and first principles methods. (28th February 2013)

• Record Type: Journal Article
• Authors: Weibin, Zhang; Weidong, Wu; Xueming, Wang; Xinlu, Cheng; Dawei, Yan; Changle, Shen; Liping, Peng; Yuying, Wang; Li, Bai
• Is Part Of: Surface and interface analysis. Volume 45:Number 8(2013:Aug.)
• Page Start: 1206
• Page End: 1210
• Publication Date: 2013-02-28
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5253
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title>ABSTRACT</title> <p>In this paper, the electronic structures of NbO₂ and Nb₂O₅ are theoretically and experimentally analyzed. The oxides in the samples are mainly consisted of NbO₂ and NbO, whereas the outmost layer of the samples is NbO₂. After exposure to air, the outermost layer on all niobium samples is Nb₂O₅. The photoelectrons from the first 2–4 Å contribute to the spectra, so the valence band structure of NbO₂ and Nb₂O₅ can be confirmed from ultraviolet photoelectron spectroscopy (UPS). By comparing the UPS with density of state results, the electronic structure of NbO₂ and Nb₂O₅ can be distinguished from each other, and then the electronic structure was deconvoluted into several electronic states. The agreement between experimental result and theory is, in the best case, satisfactory. Copyright © 2013 John Wiley &amp; Sons, Ltd.</p> </abstract>