Oxygen transport in electroceramics investigated by electrochemical 18O/16O isotope exchange and ToF‐SIMS. (1st August 2012)

• Record Type: Journal Article
• Authors: Langer‐Hansel, K.; Schintlmeister, A.; Fleig, J.; Hutter, H.
• Is Part Of: Surface and interface analysis. Volume 45:Number 1(2013:Jan.)
• Page Start: 486
• Page End: 489
• Publication Date: 2012-08-01
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5134
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>In this contribution ¹⁸O tracer diffusion experiments were carried out on electroceramics and analysed by time‐of‐flight secondary‐ion mass spectrometry. For the analysis, different operation modes of the Bi liquid metal ion gun were compared with respect to signal intensity, lateral resolution and mass resolution. Procedures for obtaining a basic estimation of the ¹⁸O fraction are given. It is shown that high target current, i.e. high number of primary ions, increases the accuracy and the precision of the determination of the ¹⁸O fraction if the observed count rate of the ¹⁶O signal is lower than 0.95 cts/shot. As an example, ¹⁸O diffusion profiles at the surface of a ZrO₂:9.5mol%Y₂O₃ single crystals are shown. Copyright © 2012 John Wiley &amp; Sons, Ltd.</p> </abstract>