New sample holder geometry for high precision isotope analyses. (5th June 2012)

• Record Type: Journal Article
• Authors: Peres, P.; Kita, N. T.; Valley, J. W.; Fernandes, F.; Schuhmacher, M.
• Is Part Of: Surface and interface analysis. Volume 45:Number 1(2013:Jan.)
• Page Start: 553
• Page End: 556
• Publication Date: 2012-06-05
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5061
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Secondary ion mass spectrometry is applied to a wide range of Geoscience applications because of its capability to provide direct <italic>in situ</italic> measurement of elemental and isotopic composition. The CAMECA IMS 1280 and 1280‐HR are large geometry ultra‐high sensitivity ion microprobes that provide excellent precision and reproducibility for isotope ratio measurements. A precision at the tenth permil level is routinely achieved for the measurement of ¹⁸O/¹⁶O ratio from 10 µm spots using multicollection Faraday Cups. However, analytical artifacts related to the surface topography and to the location of the analysis in the sample (X–Y effects) are known to bias the precision for isotope analysis. The X–Y effects have been investigated using a CAMECA prototype sample holder design. Results show a significant improvement in terms of reproducibility for analyses performed over a large area of the sample. Detailed analytical data using the new sample holder will be presented. Copyright © 2012 John Wiley &amp; Sons, Ltd.</p> </abstract>