Cite
HARVARD Citation
Perez‐Roldan, M. et al. (n.d.). Surface characterisation of PEO‐like microstructures by means of ToF‐SIMS, XPS and SPR. Surface and interface analysis. pp. 240-243. [Online].
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Perez‐Roldan, M. et al. (n.d.). Surface characterisation of PEO‐like microstructures by means of ToF‐SIMS, XPS and SPR. Surface and interface analysis. pp. 240-243. [Online].