The Storing Matter technique applied to Alq3: influence of the collector material and the sputter‐deposition energy on fragmentation. (18th December 2012)
- Record Type:
- Journal Article
- Title:
- The Storing Matter technique applied to Alq3: influence of the collector material and the sputter‐deposition energy on fragmentation. (18th December 2012)
- Main Title:
- The Storing Matter technique applied to Alq3: influence of the collector material and the sputter‐deposition energy on fragmentation
- Authors:
- Becker, N.
Wirtz, T.
Migeon, H.‐N. - Abstract:
- <abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The Storing Matter technique is derived from secondary ion mass spectrometry (SIMS) and consists in decoupling the sputtering of the specimen from the analysis step. In a dedicated prototype instrument, the sample surface is bombarded by an ion beam, and the sputtered particles are deposited at sub‐monolayer level onto a collector. In a second step, this deposit is analyzed by SIMS (static or dynamic). In this work, we applied the Storing Matter technique to tris(8‐hydroxyquinolinato)aluminum (Alq<sub>3</sub>), a common component of organic light‐emitting diodes. Alq<sub>3</sub> was sputter‐deposited onto Ag and Si collectors with different impact energies ranging from 3.75 keV to 10 keV. Positive mass spectra of these deposits and of an Alq<sub>3</sub> reference sample were acquired under static SIMS conditions with 10‐keV impact energy. The intensity ratios of the characteristic Alq<sub>3</sub> peaks are very similar for the Alq<sub>3</sub> reference spectrum and the Storing Matter deposit with 10 keV, which indicates that most of the organic fragments deposited on the collector do not undergo a second fragmentation during the analysis step. This is however not the case for the same deposit on a Si collector. As the impact energy used for the sputter‐deposition step decreases, the peak distribution is shifted in favor of the smaller fragments, indicating a higher level of<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The Storing Matter technique is derived from secondary ion mass spectrometry (SIMS) and consists in decoupling the sputtering of the specimen from the analysis step. In a dedicated prototype instrument, the sample surface is bombarded by an ion beam, and the sputtered particles are deposited at sub‐monolayer level onto a collector. In a second step, this deposit is analyzed by SIMS (static or dynamic). In this work, we applied the Storing Matter technique to tris(8‐hydroxyquinolinato)aluminum (Alq<sub>3</sub>), a common component of organic light‐emitting diodes. Alq<sub>3</sub> was sputter‐deposited onto Ag and Si collectors with different impact energies ranging from 3.75 keV to 10 keV. Positive mass spectra of these deposits and of an Alq<sub>3</sub> reference sample were acquired under static SIMS conditions with 10‐keV impact energy. The intensity ratios of the characteristic Alq<sub>3</sub> peaks are very similar for the Alq<sub>3</sub> reference spectrum and the Storing Matter deposit with 10 keV, which indicates that most of the organic fragments deposited on the collector do not undergo a second fragmentation during the analysis step. This is however not the case for the same deposit on a Si collector. As the impact energy used for the sputter‐deposition step decreases, the peak distribution is shifted in favor of the smaller fragments, indicating a higher level of fragmentation. Copyright © 2012 John Wiley &amp; Sons, Ltd.</p> </abstract> … (more)
- Is Part Of:
- Surface and interface analysis. Volume 45:Number 1(2013:Jan.)
- Journal:
- Surface and interface analysis
- Issue:
- Volume 45:Number 1(2013:Jan.)
- Issue Display:
- Volume 45, Issue 1 (2013)
- Year:
- 2013
- Volume:
- 45
- Issue:
- 1
- Issue Sort Value:
- 2013-0045-0001-0000
- Page Start:
- 537
- Page End:
- 540
- Publication Date:
- 2012-12-18
- Subjects:
- Surfaces (Physics) -- Periodicals
Surface chemistry -- Periodicals
Thin films -- Periodicals
541.33 - Journal URLs:
- http://onlinelibrary.wiley.com/ ↗
- DOI:
- 10.1002/sia.5125 ↗
- Languages:
- English
- ISSNs:
- 0142-2421
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8547.742000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 3067.xml