ToF‐SIMS and SEM‐EDS studies of palladium and ruthenium catalysts used in the reduction of selected fatty acids. (19th September 2012)

• Record Type: Journal Article
• Authors: Szynkowska, M. I.; Leśniewska, E.; Jakubowska, A.; Rogowski, J.; Góralski, J.; Paryjczak, T.
• Is Part Of: Surface and interface analysis. Volume 45:Number 1(2013:Jan.)
• Page Start: 570
• Page End: 574
• Publication Date: 2012-09-19
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5149
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and scanning electron microscopy with energy dispersive spectrometer were applied for investigation of surface studies of catalysts. The studied systems were palladium and ruthenium catalysts supported on Al₂O₃ and SiO₂. They were subjected to different thermal treatment. The studied catalysts are used in the reduction reaction of selected fatty acids. The electron microscopy allowed to analyze the composition of the surface layers of catalysts and observation of active metal crystallites on the surface. ToF‐SIMS studies gave information about chemical composition of catalyst surface, especially about interactions between metal phase and support (Pd–Al) as well as the presence of the residues coming from incomplete decomposition of precursor such as palladium chloride. The results revealed that these techniques can be successfully used in the analysis of surface physicochemical properties of prepared catalyst systems. Copyright © 2012 John Wiley &amp; Sons, Ltd.</p> </abstract>