Cite
HARVARD Citation
Barozzi, M. et al. (n.d.). Structural analysis and depth profiling of nanometric SiO2/SRO multilayers. Surface and interface analysis. pp. 373-375. [Online].
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Barozzi, M. et al. (n.d.). Structural analysis and depth profiling of nanometric SiO2/SRO multilayers. Surface and interface analysis. pp. 373-375. [Online].