Ferroelectric Photocurrent Effect in Polycrystalline Lead‐Free (K0.5Na0.5)(Mn0.005Nb0.995)O3 Thin Film. Issue 1 (13th September 2012)

• Record Type: Journal Article
• Authors: Park, Jungmin; Won, Sung Sik; Ahn, Chang Won; Kim, Ill Won; Brennecka, G. L.
• Is Part Of: Journal of the American Ceramic Society. Volume 96:Issue 1(2013)
• Page Start: 146
• Page End: 150
• Publication Date: 2012-09-13
• Subjects: Ceramics -- Periodicals; 620.1405
• DOI: 10.1111/j.1551-2916.2012.05430.x
• Languages: English
• ISSNs: 0002-7820

Abstract

<abstract abstract-type="main" xml:lang="en" id="jace5430-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p>We deposited (K_0.5Na_0.5)(Mn_0.005Nb_0.995)O₃ (KNMN) thin films on Pt(111)/TiO₂/SiO₂/Si(100) substrates with a top electrode of indium tin oxide and investigated photocurrent properties in the wavelength range of 300−400 nm. Before the photocurrent measurement, the KNMN film was poled by applying a DC voltage. The photocurrents strongly depend on the wavelength of the incident photon energy. The photocurrents of the first measurement with poling in the up (−5 V) and down (+5 V) states were 21 and 3.2 nA/cm², respectively, at 344 nm. The difference in the photocurrents in both poling directions was explained by a space charge due to an asymmetric Schottky barrier height, which was caused by an internal electric field and polarization in the KNMN thin film.</p> </abstract>