Cite
HARVARD Citation
Tamura, Y. et al. (n.d.). Reliability assessment based on hazard rate model for an embedded OSS porting‐phase. Software testing, verification & reliability. pp. 77-88. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Tamura, Y. et al. (n.d.). Reliability assessment based on hazard rate model for an embedded OSS porting‐phase. Software testing, verification & reliability. pp. 77-88. [Online].