Advanced materials characterization : basic principles, novel applications, and future directions /: basic principles, novel applications, and future directions. (2023)

• Record Type: Book
• Further Information: Note: Ch Sateesh Kumar, M. Muralidhar Singh, Ram Krishna.
• Authors: Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram
• Contents: 1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photospectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field-emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2023
• Extent: 1 online resource (130 pages), illustrations (black and white)
• Subjects: 620.112; Materials -- Properties
• Languages: English
• ISBNs: 9781000872330; 9781000872293
• Related ISBNs: 9781032375106
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.