Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials. (17th February 2023)

Record Type:: Book
Title:: Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials. (17th February 2023)
Main Title:: Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials.
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2023
Extent:: 1 online resource (60 pages)
Subjects:: 602.1841
X-ray photoelectron spectroscopy
Chemical analysis and testing
Photoelectron spectroscopy
Spectroscopy
X-rays
Depth
Languages:: English
Related ISBNs:: 9780539260014
ISSNs:: 3046-9774
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.749912
Ingest File:: 16_014.xml