Semiconductor devices. Mechanical and climatic test methods. Power cycling Part 34, (28th February 2011)

Record Type:
Book
Title:
Semiconductor devices. Mechanical and climatic test methods. Power cycling Part 34, (28th February 2011)
Main Title:
Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Issue Display:
Part 34
Part:
34
Issue Sort Value:
0000-0000-0000-0034
Publisher Details:
London : British Standards Institution
Publication Date:
2011
Extent:
1 online resource (14 pages)
Subjects:
602.1841
Destructive testing
Environmental testing
Integrated circuits
Stress
Low voltage
Climate
Electronic equipment and components
Mechanical testing
Thermal stress
Power losses
Electrical testing
Stress analysis
Semiconductor devices
Languages:
English
Related ISBNs:
9780580691645
ISSNs:
3020-9940
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.747261
Ingest File:
16_009.xml