Semiconductor devices. Micro-electromechanical devices. Four-point bending test method for interfacial adhesion energy of layered MEMS materials Part 31, (17th April 2019)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 2019
• Extent: 1 online resource (16 pages)
• Subjects: 602.1841; CD-ROM; Data layout; Data transfer; Digital signals; Recording characteristics; Optical properties of materials; Coding (data conversion); Information exchange; Recording tracks; Data transmission; Error correction; Data processing; Environment (working); Read-only storage; Dimensions; Data media; Computer storage devices; Data recording; Optical disks; Storage; Testing conditions; Optical recording; Defects
• Languages: English
• Related ISBNs: 9780580966606
• ISSNs: 3035-2563
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.