Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM . (31st January 2016)

Record Type:
Book
Title:
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM . (31st January 2016)
Main Title:
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM .
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2016
Extent:
1 online resource (174 pages)
Subjects:
602.1841
Records (documents)
Data processing
Life cycle
Software engineering techniques
Data management
Documents
Information
Process control
Data
Life (durability)
Computer software
Languages:
English
Related ISBNs:
9780580911064
ISSNs:
3032-7705
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.746990
Ingest File:
16_009.xml