Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature Part 6, (24th November 2017)

Record Type:: Book
Title:: Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature Part 6, (24th November 2017)
Main Title:: Semiconductor devices. Mechanical and climatic test methods.
Authors:: British Standards Institution,
Issue Display:: Part 6
Part:: 6
Issue Sort Value:: 0000-0000-0000-0006
Publisher Details:: London : British Standards Institution
Publication Date:: 2017
Extent:: 1 online resource (12 pages)
Subjects:: 602.1841
High temperatures
Electronic storage
Semiconductor devices
Semiconductor storage
Climate
Integrated circuits
Environmental testing
Electronic equipment and components
Mechanical testing
Languages:: English
Related ISBNs:: 9780580948923
ISSNs:: 3034-4797
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.744413
Ingest File:: 15_029.xml