Device embedded substrate. Guidelines. Test element groups (TEG) Part 2-4, (30th April 2015)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 2015
• Extent: 1 online resource (40 pages)
• Subjects: 602.1841; Damp-heat tests; Automatic control systems; Stability; Test equipment; Performance testing; Testing conditions; Grades (quality); Thermal testing; Environmental testing; Control systems; Transmitters; Accuracy; Installation; Flow measurement; Classification systems; Dynamic testing; Transducers; Safety measures; Drop tests; Mechanical testing; Electric power system disturbances; Accelerated testing; Maintenance; Process control; Impact testing; Interfaces (data processing); Technical documents; Industrial; Vibration testing; Electrical testing
• Languages: English
• Related ISBNs: 9780580821219
• ISSNs: 3027-9175
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.