Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM) Part 27, (31st January 2013)

Record Type:
Book
Title:
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM) Part 27, (31st January 2013)
Main Title:
Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Issue Display:
Part 27
Part:
27
Issue Sort Value:
0000-0000-0000-0027
Publisher Details:
London : British Standards Institution
Publication Date:
2013
Extent:
1 online resource (16 pages)
Subjects:
602.1841
Electrical testing
Grades (quality)
Sensitivity
Damage
Semiconductor devices
Classification systems
Electronic equipment and components
Test models
Mechanical testing
Electrostatics
Integrated circuits
Degradation
Climate
Environmental testing
Languages:
English
Related ISBNs:
9780580766084
ISSNs:
3025-2691
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.743449
Ingest File:
15_027.xml