Characterization techniques for nanomaterials. (2023)

• Record Type: Book
• Further Information: Note: M.L. Chamalki Madhusha, Imalka Munaweera.
• Authors: Madhusha, M. L. Chamalki; Munaweera, Imalka
• Contents: 1. Introduction to nanomaterial characterization 2. Chemical and structural characterization of nanomaterials 3. Parameters of nanomaterials which should be characterized 3.1 Morphological features 3.2 Structural defects 3.3 Optical studies 3.4 Structural analysis 3.5 Elemental studies 3.6 Size estimation 3.7 Physicochemical characteristics 3.8 Magnetic properties 4. Chemical characterization techniques in detail 4.1 Optical Spectroscopy 4.2 Electron Spectroscopy 4.3 Ionic Spectrometry 4.4 Rutherford Backscattering Spectrometry (RBS) 4.5 Secondary Ion Mass Spectrometry (SIMS) 5. Structural characterization techniques in detail 5.1 X-ray diffraction technique (XRD) 5.2 Electron microscopy 5.3 Dynamic light Scattering 5.4 X-ray absorption spectroscopy (XAS) 5.5 The Brunauer–Emmett–Teller (BET) 5.6 Thermal gravimetric analysis (TGA) 5.7 Superconducting quantum interference device magnetometry (SQUID)
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2023
• Extent: 1 online resource (128 pages), illustrations (black and white)
• Subjects: 620.115; Nanostructured materials -- Analysis; Nanochemistry
• Languages: English
• ISBNs: 9781000883602; 9781000883558
• Related ISBNs: 9781032406619
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.