Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer Part 37, (20th December 2022)

Record Type:
Book
Title:
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer Part 37, (20th December 2022)
Main Title:
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Issue Display:
Part 37
Part:
37
Issue Sort Value:
0000-0000-0000-0037
Publisher Details:
London : British Standards Institution
Publication Date:
2022
Extent:
1 online resource (60 pages)
Subjects:
602.1841
Accelerometers
Reports
Testing
Electrical failure
Failure analysis
Printed-circuit boards
Electronic components
Semiconductor devices
Semiconductors
Languages:
English
Related ISBNs:
9780539253252
ISSNs:
3046-7233
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.736731
Ingest File:
15_014.xml