Industrial artificial intelligence technologies and application. (2023)

• Record Type: Book
• Further Information: Note: Edited by Ovidiu Vermesan, Franz Wotawa, Mario Diaz Nava, Björn Debaillie.
• Editors: Vermesan, Ovidiu; Wotawa, Franz; Nava, Mario Diaz; Debaillie, Björn
• Contents: 1. Benchmarking Neuromorphic Computing for Inference 2. Benchmarking the Epiphany Processor as a Reference Neuromorphic Architecture 3. Temporal Delta Layer: Exploiting Temporal Sparsity in Deep Neural Networks for Time-Series Data 4. An End-to-End AI-based Automated Process for Semiconductor Device Parameter Extraction 5. AI Machine Vision System for Wafer Defect Detection 6. Failure Detection in Silicon Package 7. S2ORC-SemiCause: Annotating and Analysing Causality in the Semiconductor Domain 8. Feasibility of Wafer Exchange for European Edge AI Pilot Lines 9. A Framework for Integrating Automated Diagnosis into Simulation 10. Deploying a Convolutional Neural Network on Edge MCU and Neuromorphic Hardware Platforms 11. Efficient Edge Deployment Demonstrated on YOLOv5 and Coral Edge TPU 12. Embedded Edge Intelligent Processing for End-To-End Predictive Maintenance in Industrial Applications 13. AI-Driven Strategies to Implement a Grapevine Downy Mildew Warning System 14. On the Verification of Diagnosis Models
• Edition: 1st
• Publisher Details: Gistrup : River Publishers
• Publication Date: 2023
• Extent: 1 online resource (150 pages)
• Subjects: 006.3; Artificial intelligence -- Industrial applications
• Languages: English
• ISBNs: 9781000852059; 9781000852035
• Related ISBNs: 9788770227919
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.