Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer Part 37, (22nd November 2022)

Record Type:: Book
Title:: Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer Part 37, (22nd November 2022)
Main Title:: Semiconductor devices. Mechanical and climatic test methods.
Authors:: British Standards Institution,
Issue Display:: Part 37
Part:: 37
Issue Sort Value:: 0000-0000-0000-0037
Publisher Details:: London : British Standards Institution
Publication Date:: 2022
Extent:: 1 online resource (28 pages)
Subjects:: 602.1841
Semiconductor devices
Semiconductors
Electronic components
Printed-circuit boards
Electrical failure
Failure analysis
Testing
Reports
Accelerometers
Languages:: English
Related ISBNs:: 9780539151992
ISSNs:: 3042-5837
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.730710
Ingest File:: 14_059.xml