Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors. (11th November 2022)

Record Type:: Book
Title:: Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors. (11th November 2022)
Main Title:: Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors.
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2022
Extent:: 1 online resource (16 pages)
Subjects:: 602.1841
Testing methods
Metal oxide semiconductors
Semiconductors
Electronic equipment and components
Semiconductor devices
Languages:: English
Related ISBNs:: 9780539126433
ISSNs:: 3040-9286
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.723179
Ingest File:: 14_044.xml