Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly Part 10, (15th September 2022)

Record Type:: Book
Title:: Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly Part 10, (15th September 2022)
Main Title:: Tracked Changes. Semiconductor devices. Mechanical and climatic test methods.
Authors:: British Standards Institution,
Issue Display:: Part 10
Part:: 10
Issue Sort Value:: 0000-0000-0000-0010
Publisher Details:: London : British Standards Institution
Publication Date:: 2022
Extent:: 1 online resource (38 pages)
Subjects:: 602.1841
Impact testing
Mechanical testing
Semiconductor devices
Destructive testing
Climate
Integrated circuits
Mechanical shock
Electronic equipment and components
Environmental testing
Languages:: English
Related ISBNs:: 9780539234824
ISSNs:: 3046-0178
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.722412
Ingest File:: 14_042.xml