Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly Part 10, (16th August 2022)

Record Type:: Book
Title:: Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly Part 10, (16th August 2022)
Main Title:: Semiconductor devices. Mechanical and climatic test methods.
Authors:: British Standards Institution,
Issue Display:: Part 10
Part:: 10
Issue Sort Value:: 0000-0000-0000-0010
Publisher Details:: London : British Standards Institution
Publication Date:: 2022
Extent:: 1 online resource (16 pages)
Subjects:: 602.1841
Integrated circuits
Destructive testing
Electronic equipment and components
Mechanical shock
Environmental testing
Climate
Mechanical testing
Impact testing
Semiconductor devices
Languages:: English
Related ISBNs:: 9780539173451
ISSNs:: 3043-5580
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.715568
Ingest File:: 14_029.xml