Reliability and failure analysis of high power LED packaging. (2022)

• Record Type: Book
• Further Information: Note: Cher Ming Tan, Preetpal Singh.
• Authors: Tan, Cher Ming, 1959-; Singh, Preetpal
• Contents: 1. LED package materials; 2. LED failure mechanisms; 3. LED failure analysis techniques; 4. Effect of environment on LED lifetime and package reliability assessment; 5. Lumen recovery in high power LEDs under prolonged outdoor operation; 6. LED permanent degradation mechanisms under prolonged outdoor applications; 7. Effect of phosphors in LEDs and package degradation; 8. Blue vs White LED package degradation in LEDs under different conditions; 9. LED package degradation in outdoor applications and its evolution with time; 10. Reliability tests for LEDs; 11. Conclusion and Future Work
• Publisher Details: Oxford : Woodhead Publishing
• Publication Date: 2022
• Extent: 1 online resource, illustrations (colour)
• Subjects: 620.00452; Reliability (Engineering); Failure analysis (Engineering); Light emitting diodes -- Reliability; Packaging
• Languages: English
• ISBNs: 9780128224076
• Related ISBNs: 9780128224083
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.