Advances in imaging and electron physics. Volume 223 (2022)

• Record Type: Book
• Further Information: Note: Edited by Martin Hÿtch and Peter W. Hawkes.
• Editors: Hÿtch, Martin; Hawkes, P. W
• Contents: Preface Martin Hÿtch and Peter W. Hawkes 1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 2. Development of a global homography-based approach for high-angular resolution in the SEM Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 3. Implementing the homography-based global approach Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 4. Numerical validation and influence of optical distorsions on accuracy Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 5. Applications of the method Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices Clifford M. Krowne
• Publisher Details: Amsterdam : Academic Press
• Publication Date: 2022
• Extent: 1 online resource
• Subjects: 621.367; Optoelectronic devices; Optical data processing
• Languages: English
• ISBNs: 9780323988643
• Related ISBNs: 9780323988636
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
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