BS ISO 14606. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials. (14th March 2022)

Record Type:: Book
Title:: BS ISO 14606. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials. (14th March 2022)
Main Title:: BS ISO 14606. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials.
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2022
Extent:: 1 online resource (24 pages)
Subjects:: 602.1841
Chemical analysis and testing
Depth
Spectroscopy
X-rays
Photoelectron spectroscopy
X-ray photoelectron spectroscopy
Languages:: English
ISSNs:: 3044-0164
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.680811
Ingest File:: 11_012.xml