Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists. (2022)

• Record Type: Book
• Further Information: Note: Dong ZhiLi.
• Authors: Dong, ZhiLi
• Contents: Part I: Introduction to Crystallography 1. Periodicity of Crystals and Bravais Lattices 2. Symmetry of Crystals, Point Groups and Space Groups 3. Reciprocal Lattice 4. Examples for Crystal Structure Representation Part Ii: X-ray Diffraction of Materials 5. Geometry of X-ray Diffraction 6. Intensity of Diffracted X-ray Beam 7. Experimental Methods and Powder X-ray Diffractometer 8. Rietveld Refinement of Powder X-ray Diffraction Patterns Part Iii: Transmission Electron Microscopy of Materials 9. Atomic Scattering Factors for Electrons and X-rays 10. Electron Diffraction in Transmission Electron Microscope 11. Diffraction Contrast 12. Phase Contrast
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2022
• Extent: 1 online resource, illustrations (black and white)
• Subjects: 543; Materials -- Analysis; Crystallography; X-ray diffraction imaging; Transmission electron microscopy
• Languages: English
• ISBNs: 9781000569902; 9781000569889; 9780429351662
• Related ISBNs: 9780367357948
• Notes: Note: Includes bibliographical references and index.; Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.