The handbook of surface imaging and visualization. (2021)

• Record Type: Book
• Other Titles: Surface imaging and visualization
• Further Information: Note: Arthur T. Hubbard.
• Authors: Hubbard, Arthur T
• Editors: Hubbard, Arthur T
• Contents: ANGLE RESOLVED AUGER ELECTRON SPECTROSCOPY, D.G. Frank, Introduction, Auger Electron Emission from Solid Surfaces, The Auger Phenomenon, Angle-Resolved Auger Electron Measurements, Experimental Considerations, Auger Electron KE and the "Secant Effect", Incident Radiation, Angle-Resolving Analyzers, Auger Signal Detection, Data Visualization, Theoretical Approaches, Basic Principles, Empirical Trends, Empirical Blocking Model, Inelastic Scattering, Elastic Scattering, Example Applications, Depth Profiling, Monolayer Structure, Bilayer Structure, Single Crystals, Layered Crystals, Acknowledgements, References, Atomic Force Microscopy, A.A. Gewirth and J.R. LaGraff, Introduction, General Principles, AFM Operation, Tip-Sample Interaction, Representative Results, Electrochemistry, Biological Systems, Self-Assembled Langmuir-Blodgett Films, Crystal Dissolution and Growth, Future Prospects, Acknowledgement, References, Auger Electron Spectroscopy, N.H. Turner, Introduction, Basics, Elemental Identification, Surface Sensitivity, Overview of Spectral Features, Instrumentation, Vacuum Systems, Electron Sources, Energy Analyzers, Other Accessories, Spectral Features, Main Spectral Features, Charging, Quantification, Summary, References, Chemical Imaging Using Ion Microscopy, I. Gay and G.H. Morrison, Introduction, Instrumentation, Detection and Image Acquisition Systems, Quantification, Applications of Ion Microscopy, Materials Science and Geology, Biology and Medicine, Conclusions, Acknowledgements, References, Collision Induced Surface Processes, S.T. Ceyer, Introduction, Examples of Collision Induced Surface Processes, Translational Activation, Collision Induced Activation, Collision Induced Desorption, Collision Induced Absorption, Collision Induced Recombinative Desorption, Signficance of Collision Induced Surface Processes, References, Depth Profiling, G.B. Hoflund, Introduction, The Ion Sputtering Process, Pure Materials, Multicomponent Solids, References, Electrochemical Epitaxy, H.M. Baoming, T.E. Lister, and J.L. Stickney, Introduction, Experimental, Electrochemical Atomic Layer Epitaxy, Acknowledgements, References, Electrochemical Nucleation, R. de Levie, The Energetics of Nucleation, The Thermodynamics of Nucleated Monolayer Films, The Kinetics of Nucleation, Growth, Overlap, Experimental Observations, Metal Deposition, The Formation of Salt Layers, Condensation of Adsorbate Films, Relevance for Studies at the Metal-Vacuum Interface, General References, Electrochemical Quartz Crystal Microbalance Studies of Electroactive Surface Films, S. Bruckenstein and R. Hillman, Principles of the Quartz Crystal Microbalance, In situ Application: The Electrochemical Quartz Crystal Microbalance, Chemical Principles, Chemical Systems, Polymer Films, Metal Oxide Films, Other Systems, Future Prospects, Absolute Measurement of Solvent Content, Crystal Impedance Modeling, Surface Morphology, Summary, References, Electron Beam Lithography, F.J. Hohn, Introduction, Classes of Electron Beam Lithography Tools, Gaussian Round Beam Systems, Variable Shape Beam Systems, Performance Limitations, Resolution, Accuracy, Electron Beam Lithography-Integration Considerations, Proximity Effect, Electron Beam Lithography Applications, Application Emphasis, Application for Nano-Devices, Summary, References, Electron Microscopy, J.M. Cowley, Introduction, The Scattering of High Energy Electrons by Matter, Instruments for Electron Microscopy, Use of Electron Microscopes for Surface Studies, Transmission Electron Microscopy, Plan-View Diffraction and Imaging, Profile Imaging, Transmission Electron Holography, Reflection Electron Microscopy (REM), RHEED and REM, Contrast and Resolution in REM, Scanning Reflection Electron Microscopy, Reflection Electron Energy-Loss Analysis, Reflection Electron Holography, Imaging with Secondary Radiation, Secondary Electron Microscopy, Scanning Auger Microscopy, X-Ray Emission, Special Topics, UHV Instruments, Very Low Voltage Electron Holography, Conclusions, References, Electron Stimulated Desorption-Ion Angular Distribution (ESDIAD), J.T. Yates, Jr., Introduction, The ESDIAD Phenomenon, The ESDIAD Measurement Technique, Selected Examples of ESDIAD Measurements on Metal and Semiconductor Surfaces, Chemisorption on a Metal Surface, Chemisorption on a Semiconductor Surface, Future Directions, Acknowledgements, References, Field Emission Ion Sources for Focused Ion Beams, J. Orloff, Introduction, Field Emission Process, Field Ionization, Field Evaporation, Liquid Metal Ion Sources, Properties of Field Emission Ion Sources, Gas Phase Field Ionization Sources, Liquid Metal Ion Sources, Implications for Focused Ion Beam Formation, References, Field Emission Microscopy, J.J. Hren and J. Liu, Surface Electron Microscopies, Field Electron Emission, Field Emission Microscopy, Field Emission from Crystals, The Theoretical Resolution of FEM, Practical FEM, The FEM of Absorbed Molecules, Combining Field Emission and Field Ion Microscopy, References, Field-Ion Microscopy and Spectroscopy, G. Ehrlich and N. Ernst, Historical Introduction, The Field Ion Microscope, Selected Applications, FIM Variants, The Atom Probe, Field Ion Appearance Energy Spectroscopy, Summary, Acknowledgements, References, Fluid-Fluid Interfaces: Optical Imaging of Capillary Systems, A.D. Nikolov and D.T. Wasan, Introduction, Imaging a Profile of a Fluid by Light Interference Phenomena, Reflection Interferometry, Differential Interferometry, Film Thickness Interferometry, Imaging the Film Structure by Using Diffractive Scattering Phenomena, Imaging Film Structure by Small Angle Diffraction, Imaging Film Structure by Background Light Scattering Diffraction, Imaging Film Structure by Light Scattering, Acknowledgements, References, Fullerenes Viewed by Scanning Tunneling Microscopy, Photoemission, and Inverse Photoemission, J.H. Weaver, Introduction, STM of Fullerene Films, Electron Spectroscopy of Fullerenes, C60 Valence and Conduction Bands, C84 and Graphite Valence Bands, C 1s Satellites and Plasmons for C60, C84, and Graphite, Summary, Acknowledgements, References, High Resolution Electron Energy Loss Spectroscopy, L.L. Kesmodel, Introduction, Experimental Apparatus, Theory, Dipole Scattering, Impact Scattering, Resonance Scattering, Examples, Applications, Supported Catalysts (Metal Clusters), Characterization of Insulators for Silicon Technology, Polar Materials: Oxides, Polymer Surfaces, References, Imaging of Colliodal Particles, E. Matijevic, Introduction, Preparation of Uniform Colloids, Spherical Colloidal Particles, Coated and Hollow Particles, Colloidal Particles of Other Shapes, References, Infrared Attenuated Total Reflection Spectroscopy of Surface Active Species, R.P. Sperline and H. Freiser, Introduction, Overview, Research Objectives, Spectra of Adsorbates on Coated Optics, Adsorbate Orientation Studies Using Coated Optics, Advantages and Feasibility of ATR, Literature Applications of ATR, Self-Assembled Mono-/Bi-Layers, Experimental Approach, Spectra of the Surfactants Themselves, Probes Molecules for Film Structure, Materials and Equipment, Infrared Spectroscopy of Surfaces, J. Benziger, Introduction, Principles of Infrared Absorption, Types of Spectrometers, Transmission Spectroscopy, Metal Oxides, Supported Metals, Reflection Spectroscopy, External Reflection, Surface Kinetics, Internal Reflection, Other Techniques, Diffuse Reflectance, Photoacoustic and Photothermal Deflection, Emission Spectroscopy, Summary of Surface Infrared Techniques, References, Langmuir--Blodgett Films, A. Ullman, Introduction, LB Films of Long-Chain Fatty Acids, LB Films of Liquid-Crystalline Amphiphiles, LB Films of Porphyrins and Phthalocyanines, LB Films of Polymerizable Amphiphiles, LB Films of Polymeric Amphiphiles, Potential Applications of LB Films, References, LEED Pattern Directory, D.G. Frank, Introduction and Theory, Introduction, Experimental, Basic Principles, Surface Dimensions from LEED Patterns, References, Hexagonal Surface Tabulations, Table of All Unit-Cells, Table of Primitive Unit-Cells, Table of Structures and LEED Patterns, Low-Energy Electron Diffraction: Some Basic Conceptual Tools, P.A. Thiel, Introduction, Definition of k and s, The Bragg Condition for a One-Dimensional Periodic Lattice, The Laue Condition for a One-Dimensional Periodic Lattice, Reciprocal Space Vectors, The Ewald Construction, The Typical LEED Experiment, Diffraction Profile as a Function of Island Size, Diffraction Profile in Terms of the Pair Correlation Function, Acknowledgements, References, Low-Energy Electron Microscopy, E. Bauer, Clean Surfaces: Morphology, Phase Transitions, Growth, Sublimation, Absorption, Segregation, Reactions, Thin Films: Growth, Structural Transitions, and The Interaction of Slow Electrons with Matter, Low-Energy Electron Microscopes, Resolution and Contrast, Applications, Desorption, Magnetic Microstructure, Outlook, References, Low Energy Ion Scattering Spectroscopy, S.H. Overbury, Introduction, Techniques, Fundamental Concepts in Ion Scattering, Application to Surface Imaging and Visualization, Acknowledgement, References, Magnetism in Low Dimensional Systems: Magnetic Properties of Thin Films, R. Wu, D. Wang, and A.J. Freeman, Summary, Introduction, Magnetic Moment Enhancement in Low-Dimensional Systems, Transition Metals, Rare Earth Metal Surface: Gd(0001), Interfacial Effects, 3d Overlayers on Inert Substrates, 3d Overlayers on Transition Metal Substrates, Possibility to Realize 4d Magnetism, Fermi-Contact Hyperfine Field, Spin Density at the Fermi Level, Magneto-Crystalline Anisotropy, Magneto-Optical Effects, Smoke, Magneitc Circular X-Ray Dichroism, Conclusion, Acknowledgements, References, Metal Clusters on Oxides, X. Xu and D.W. Goodman, Introduction, Preparation of Metal Clusters on an Oxide Support, Metal Cluster Properties, Cohesive Energy, Size, Structure, Catalytic Activity, Cluster-Oxide Interactions, Concl
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2021
• Extent: 1 online resource
• Subjects: 620.44; Surfaces (Technology) -- Analysis; Spectroscopic imaging; Surface chemistry
• Languages: English
• ISBNs: 9781000722727
• Related ISBNs: 9781000714906; 9780367811815
• Notes: Note: Description based on CIP data; resource not viewed.
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