Semiconductor devices. Micro-electromechanical devices. Test methods of micro-electromechanical inertial shock switch threshold Part 40, (14th September 2021)

Record Type:
Book
Title:
Semiconductor devices. Micro-electromechanical devices. Test methods of micro-electromechanical inertial shock switch threshold Part 40, (14th September 2021)
Main Title:
Semiconductor devices. Micro-electromechanical devices.
Authors:
British Standards Institution,
Issue Display:
Part 40
Part:
40
Issue Sort Value:
0000-0000-0000-0040
Publisher Details:
London : British Standards Institution
Publication Date:
2021
Extent:
1 online resource (14 pages)
Subjects:
602.1841
Test methods
Semiconductor technology
Electronic equipment and components
Electromechanical devices
Semiconductor devices
Integrated circuits
Languages:
English
Related ISBNs:
9780539070330
ISSNs:
3040-5218
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.635258
Ingest File:
06_020.xml