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Printed electronics. Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method Part 503-3, (8th September 2021)
Record Type:
Book
Title:
Printed electronics. Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method Part 503-3, (8th September 2021)
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.