Advances in imaging and electron physics. Volume 219 (2021)

• Record Type: Book
• Further Information: Note: Edited by Peter W. Hawkes.
• Editors: Hawkes, P. W
• Contents: Preface Martin Hÿtch and Peter W. Hawkes 1. Introduction to strain characterization method in transmission electron microscopy Alexandre Pofelski? 2. Moiré sampling in scanning transmission electron microscopy Alexandre Pofelski? 3. Scanning transmission electron microscopy moiré sampling geometrical phase analysis (STEM moiré GPA) Alexandre Pofelski? 4. Performance of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 5. Applications of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail 7. Superconducting electron lenses David Hardy 8. Lorentz microscopy or electron phase microscopy of magnetic objects Richard Harry Wade
• Publisher Details: Amsterdam : Academic Press
• Publication Date: 2021
• Extent: 1 online resource
• Subjects: 621.367; Optoelectronic devices; Optical data processing
• Languages: English
• ISBNs: 9780323850971
• Related ISBNs: 9780128246122
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.