Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics under bending deformation for flexible electromechanical devices Part 35, (20th April 2021)

Record Type:
Book
Title:
Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics under bending deformation for flexible electromechanical devices Part 35, (20th April 2021)
Main Title:
Semiconductor devices. Micro-electromechanical devices.
Authors:
British Standards Institution,
Issue Display:
Part 35
Part:
35
Issue Sort Value:
0000-0000-0000-0035
Publisher Details:
London : British Standards Institution
Publication Date:
2021
Extent:
1 online resource (24 pages)
Subjects:
602.1841
Semiconductor technology
Electromechanical devices
Deformation
Test methods
Semiconductor devices
Languages:
English
Related ISBNs:
9780580994951
ISSNs:
3036-4444
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.608997
Ingest File:
04_092.xml