Reliability of semiconductor lasers and optoelectronic devices. (2021)

• Record Type: Book
• Further Information: Note: Edited by Robert Herrick, Osamu Ueda.
• Editors: Herrick, Robert J; Ueda, Osamu
• Contents: List of contributors xi Preface xiii Acknowledgments xv 1 Introduction to optoelectronic devices 1 Robert W. Herrick and Qiang Guo 1.1 Introduction 1 1.2 Optoelectronic applications 2 1.3 Principles of operation for optoelectronic components 11 1.4 Method of fabrication 25 1.5 Critical metrics 31 1.6 Laser and light-emitting diode reliability 35 1.7 New technology developments 36 1.8 Summary 41 References 41 2 Reliability engineering in optoelectronic devices and fiber optic transceivers 47 Robert W. Herrick 2.1 Reliability engineering organizations and management 47 2.2 Developing a product: design for reliability 49 2.3 Developing a test plan: standards-based testing versus customized testing 53 2.4 Test engineering and data collection 67 2.5 Data collection and analysis 69 2.6 Failure analysis 80 2.7 Physics of failure and common failure mechanisms 80 2.8 Product release, ongoing monitoring, and postrelease support 82 2.9 Conclusion 83 References 84 3 Case studies in fiber optic reliability 89 Robert W. Herrick 3.1 Introduction 89 3.2 Group 1: issues that were caught before product release 90 3.3 Group 2: cases that had reliability issues from the start, but were not detected in the reliability qualification 98 3.4 Group 3: parts that were reliable after release, but later developed reliability issues during high-volume manufacturing 104 3.5 Conclusion 111 References 111 4 Materials science of defects in GaAs-based semiconductor lasers 113 Kunal Mukherjee 4.1 Introduction 113 4.2 Characteristics of simple point defects in GaAs 114 4.3 Dislocations in GaAs 122 4.4 Epitaxial integration of GaAs-based materials on silicon 143 4.5 Recombination-enhanced processes 152 4.6 Outlook 166 References 167 5 Grown-in defects and thermal instability affecting the reliability of lasers: III Osamu Ueda and Shigetaka Tomiya 5.1 Introduction 177 5.2 Grown-in defects in III 5.3 Influence of grown-in defects on device reliability and degradation in III-V based optoelectronics 193 5.4 Grown-in defects in III-nitrides 202 5.5 Composition-modulated structures and ordered structures in III-V based optoelectronics 214 5.6 Thermal instability in III-nitrides 226 5.7 Conclusion 232 References 233 6 Reliability of lasers on silicon substrates for silicon photonics 239 Justin C. Norman, Daehwan Jung, Alan Y. Liu, Jennifer Selvidge, Kunal Mukherjee, John E. Bowers and Robert W. Herrick 6.1 Introduction 239 6.2 Early-stage prospective technologies 240 6.3 Heterogeneous lasers on silicon 242 6.4 Heteroepitaxial lasers grown on silicon substrates 246 6.5 Reliability results for quantum dot lasers grown on silicon substrates 250 6.6 Degradation mechanisms in quantum dot lasers on silicon 259 6.7 The path forward and future improvements for quantum dot lasers grown on silicon substrates 265 6.8 Conclusion 267 Acknowledgments 268 References 268 7 Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs 273 C. De Santi, A. Caria, F. Piva, G. Meneghesso, E. Zanoni and M. Meneghini 7.1 Introduction 273 7.2 Degradation of InGaN visible LEDs 273 7.3 Degradation of AlGaN UV LEDs 292 7.4 Conclusions 303 References 304 Index 313
• Publisher Details: Oxford : Woodhead Publishing
• Publication Date: 2021
• Extent: 1 online resource, illustrations (black and white, and colour)
• Subjects: 621.381045; Optoelectronics; Semiconductor lasers
• Languages: English
• ISBNs: 9780128192559
• Related ISBNs: 9780128192542
• Notes: Note: Description based on CIP data; resource not viewed.
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