Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing Part 30, (30th September 2020)

Record Type:
Book
Title:
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing Part 30, (30th September 2020)
Main Title:
Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Issue Display:
Part 30
Part:
30
Issue Sort Value:
0000-0000-0000-0030
Publisher Details:
London : British Standards Institution
Publication Date:
2020
Extent:
1 online resource (18 pages)
Subjects:
602.1841
Semiconductor devices
Electronic equipment and components
Mechanical testing
Performance testing
Specimen preparation
Environmental testing
Reliability
Climate
Surface mounting devices
Integrated circuits
Languages:
English
Related ISBNs:
9780539045833
ISSNs:
3039-4482
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.562246
Ingest File:
03_189.xml