Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam. (26th August 2020)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 2020
• Extent: 1 online resource (38 pages)
• Subjects: 602.1841; Ceramics; Special ceramics; Test methods; Crystalline state; Quality; Thin films
• Languages: English
• Related ISBNs: 9780580985898
• ISSNs: 3036-0822
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.